The increasing complexity of integrated circuits (ICs), heightened power needs, higher power accuracy standards by lower VDD levels, expanded vector memory requirements, support for functional test operations, and cost of test considerations presents a multifaceted landscape of challenges for semiconductor test. Successfully navigating these challenges requires innovative approaches, collaborative efforts, and a commitment to advancing test methodologies to meet the evolving demands of the semiconductor industry.
With our digital solution, we offer a turnkey solution and expertise on socket, handling solution and load board design.
We are a market leader in digital solutions, providing exceptional power accuracy, power per system, and the most advanced per pin electronics in terms of speed. Our XPS256, XHC32, Pin Scale 5000 and Link Scale prepare us for future challenges posed by applications like AI, HPC and mobile.
The rapidly evolving wireless communications industry is challenging today’s RF solutions. Cost- of-Test and Time-to-Quality are the main drivers for RF ATE solutions to provide high parallelism and high performance as well as massive multi-site capabilities.
The V93000 Wave Scale RF (WSRF) solution addresses these requirements for RF and millimeter wave applications including Cellular 5G / 5G Advanced / NR RedCap, WiFi 6/6E/7, UWB, Bluetooth, GPS, ZigBee, WiGig, Sparklink and many other upcoming standards, across all device types, including transceivers, power amplifiers, modules and RF-SOCs.
Utilizing an advanced architecture with independent RF subsystems, based on the V93000 innovative test processor-per-pin and additional custom RF ICs, WSRF provides the necessary RF performance while offering massive parallel testing.
The WSRF instrument front-end, which uses a combination of splitter and switch at its output, brings together the best of both worlds – high precision serial measurements and high throughput parallel measurements – for both transmit and receive. In addition, the environment friendly water-cooled architecture contributes to delivering industry leading RF port density, reliability, and measurement stability & repeatability for an ATE RF instrument. The V93000 EXA Scale with its industry leading broad suite of instruments, is uniquely positioned to meet the test challenges of these integrated RF-SoC devices.
New challenges such as ADAS integration, precise battery cell monitoring & balancing, and enhanced safety features are demanding for cutting-edge microprocessors, sensors, and battery management system (BMS) chips. These ICs have unique requirements for testing and characterization. V93000 EXA Scale can test these chips due to its scalable, flexible configuration and universal instrumentation.
The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with uncompromised features such as high-density instrumentation enabling cost efficient parallel testing as well as universal per pin architecture. The floating design of the instruments enables testing of high- and low-side power structures, and the fully pattern-based operation maximizes the test throughput.
The V93000 power and analog solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. With high density cards, universal features and precision force and measurement capabilities, the power and analog solution enables leading CoT savings at high site count testing.